hBN monolayer on curved Ni(1 1 1). Top, STM and, bottom, LEED for a monolayer of hBN homogeneously covering the curved Ni crystal sketched in the center. The STM images have been taken at the positions roughly indicated over the sample. LEED patterns correspond to the center ((1 1 1) plane), midway (vicinal angle α = ±7°), and densely stepped edges (α = ±15°) of the sample and have been acquired using 63 eV electron impinging parallel to the [1 1 1] direction in all cases. Insets in STM images belong to the indicated line profiles, which prove the presence of hBN-covered microfacets.
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